WDS

Patent Granted Wavelength-dispersive X-ray spectroscopy (WDXRF or WDS) is a method used to count the number of X-rays of a specific wavelength diffracted by a crystal. The wavelength of the impinging X-ray and the crystal's lattice spacings are related by Bragg's law and produce constructive interference if they fit the criteria of Bragg's law. Unlike the related technique of energy-dispersive X-ray spectroscopy (EDS), WDS reads or counts only the X-rays of a single wavelength at time, not producing a broad spectrum of wavelengths or energies simultaneously. WDS is mainly used in chemical analysis, in an X-ray fluorescence spectrometer, in an electron microprobe, and may be used in a scanning electron microscope.