Electrode device analysis

Patent Granted PROBLEM TO BE SOLVED: To analyze accurately deterioration of an electronic device, and to discriminate accurately the electronic device. SOLUTION: This electronic device is equipped with an actual operation circuit operating at an actual operation time of the electronic device; the third testing circuit and the second testing circuit operating at a test time of the electronic device; and a power source part keeping a state where a supply voltage is not applied to the second testing circuit and applying the supply voltage to the actual operation circuit and the third testing circuit at the actual operation time of the electronic device, and applying the supply voltage to the second testing circuit at a discrimination time of the electronic device.