Official title and information are available only for Plus and Premium subscribers.
Patent Granted A wavelength division image measuring device for dividing wideband incident light from a measurement object into a plurality of wavelengths with high selectivity and measuring these images simultaneously and collectively. Micro periodic irregular lattice is formed on a substrate (302). A plurality of micro element regions (101) having different lattice shapes or lattice periods are arranged repeatedly in the plane of the substrate (302).
To see the additional information details please login and subscribe to a Plus or Premium account.
