Atomic force microscope probe

Patent Granted An AFM probe is a consumable measuring device with a sharp tip on the free-swinging end of a cantilever that is protruding from a holder plate.[5] The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is in the scale of a few nanometers. The holder plate, also called holder chip, - often 1.6 mm by 3.4 mm in size - allows the operator to hold the AFM probe with tweezers and fit it into the corresponding holder clips on the scanning head of the Atomic force microscope.