Other
Category
United states of America
Geographic Coverage
Not Available
Video URL
Not Available
Sale price (USD)
Not Available
Non-exclusive license price (USD)
Not Available
Exclusive license price (USD)
Not Available
Non-exclusive license royalty rate %
Availability
Plus or Premium required
IP number
Plus or Premium required
Patent family
Plus or Premium required
Number of members in the patent family
Plus or Premium required
Applicant(s)
Plus or Premium required
Inventor(s)
Plus or Premium required
Assignee(s) / Patent owner(s)
Plus or Premium required
Priority date
Plus or Premium required
Application date
Plus or Premium required
Grant Date
Plus or Premium required
IPC / #
Plus or Premium required
CPC
Plus or Premium required
USPC
Plus or Premium required
Link to patent publication
To see the additional information details please login and subscribe to a Premium account.

Scanning probe microscopy

Patent Granted Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded with the invention of the scanning tunneling microscope in 1981.

BROKER APPLY submit an inquiry
photo To see the additional information details please login and subscribe to a Plus or Premium account.

Related IPs