Kerr effect microscope

特許 権利維持 PROBLEM TO BE SOLVED: To provide a Kerr effect microscope capable of specifying a magnetization direction. SOLUTION: The Kerr effect microscope includes: probe light incidence means (1 and 2) configured so as to allow first probe light (6x) to be incident on a sample in a first direction and allow second probe light (6y) to be incident on the sample in a second direction different from the first direction; and magnetization direction specifying means (3 and 4) which specifies a magnetization direction in each position of the sample in accordance with first reflected light (7x) resulting from reflection of the first probe light (6x) by the sample and second reflected light (7y) resulting from reflection of the first probe light (6y) by the sample.