公式タイトルと情報はIP Exchange PlusとPremiumのユーザーのみが利用可能です。
特許 権利維持 A testing circuit is provided with a plurality of transistors, which are to be measured and electrically arranged in parallel; a selecting section for sequentially selecting the transistors to be measured; and an output section for sequentially outputting source voltages of the transistors sequentially selected by the selecting section.
追加情報の詳細を見るにはIP Exchange PlusまたはIP Exchange Premiumアカウントにアップグレードする必要があります
