Magnetic field applying device

Patent Granted PROBLEM TO BE SOLVED: To provide a magnetic field applying device of an electron microscope wherein the application correcting angle of a sample can be increased without enlarging the device. ; SOLUTION: This magnetic field applying device of the transmission electron microscope comprises a plurality of deflectors to swingingly return the optical axis deflection of an irradiated electron beam generated simultaneously with application of the magnetic field onto the optical axis, and is formed so that the deflection main surface of one deflector is disposed at a position extremely close to the surface of the sample 6.